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Figure 3
Dependence of the layer thickness in an Hf/Fe multilayer film on the position from the spinning centre of the substrate, with and without spinning (10 turns s−1). The bilayer thicknesses of Hf and Fe were estimated from the low-angle diffraction peaks from X-ray diffraction of the layer structure (Takagi et al., 1995BB8).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 603-605
https://doi.org/10.1107/S0909049598001496
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