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Figure 3
An IP diffraction image under G-GIXD geometry (θin = 0.4°) from an MgO surface thin layer (∼20 nm) formed on an Al 4.5 wt% Mg heat-treated alloy.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 488-490
https://doi.org/10.1107/S090904959800123X
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