view article
Figure 5
Transmission geometry for strain profiling on layered polycrystalline structures. The sample is scanned in the indicated z direction and the scattering angles are measured. The height of the line focus limits the spatial resolution to which strain gradients may be detected. Experiments were performed employing both the Laue–Bragg monochromator/multilayer combination and the Laue focusing optics to produce narrow line foci of 4 µm and 1.2 µm height, respectively.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 226-231
https://doi.org/10.1107/S0909049598001393
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS