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Figure 6
(a) Cross section of the Cu/Ni multilayer sample. (b) Contour plot of the axial [111] diffraction pattern from the sample using the bent Laue focusing optics (cf. Figs. 4[link] and 5[link]). Plotted is the square root of the intensity versus depth and detector position. The contour spacing for the Cu layers is twice the spacing for the Ni layers. The detector position relates directly to the scattering angle as indicated by the vertical mark.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 226-231
https://doi.org/10.1107/S0909049598001393
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