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Figure 2
χ2 distribution versus parameters of the Cu layer obtained by least-squares methods for the reflectivities shown in Fig. 1[link]; (a) versus Cu thickness (tCu) offset from optimum, (b) versus interface width (σCu) between upper NiFe and Cu layer, (c) versus δ of Cu.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 969-971
https://doi.org/10.1107/S0909049597017299
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