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Figure 2
The profile fitting based on the calculated intensities from the MEM electron density for (a) Y@C82 and (b) Sc2@C84.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 977-979
https://doi.org/10.1107/S0909049597016816
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