Micro X-ray diffraction analysis of thin films using grazing-exit conditions

Noma, T.; Iida, A.

doi:10.1107/S090904959701755X

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 3
Converted X-ray diffraction curves at various exit angles (α). Each diffraction curve is the diffraction curve at a constant α as a function of 2θ. (a) Pt/SiO₂, (b) Pd/SiO₂, (c) Pd/Pt/SiO₂.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 5| Part 3| May 1998| Pages 902-904

https://doi.org/10.1107/S090904959701755X

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