Micro X-ray diffraction analysis of thin films using grazing-exit conditions

Noma, T.; Iida, A.

doi:10.1107/S090904959701755X

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 4
Diffraction peak height and diffraction angle as a function of exit angle. (a) Pt/SiO₂, (b) Pd/SiO₂, (c) Pd/Pt/SiO₂. Full circles: measured data. Solid lines: calculated curves for diffraction peak height. Dashed lines: calculated curves for diffraction angle.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 5| Part 3| May 1998| Pages 902-904

https://doi.org/10.1107/S090904959701755X

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page