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![[Figure 1]](he3170fig1mag.jpg)
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Figure 1
Schematic diagram showing a simple focusing optical arrangement for X-ray scattering in which the 2 mm size source is demagnified to produce a 1 mm size focus with a consequent increase in angular divergence. The incident beam is then collimated down to match the size of the specimen. The specimen intercepts and scatters the incident beam. The scattered beam is broadened (hatched area) with respect to the incident beam due to sample effects. The scattered beam is intercepted by a detector which has a resolution shown by the vertical dashed line along the detector. Position–angle phase-space diagrams are shown for the beam at various positions along the optical path with the horizontal axis representing the beam size and the vertical axis the beam divergence. Similar diagrams can be drawn for the case where one is focusing on the detector instead of the sample. |
![[Figure 1]](he3170fig1.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
