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Figure 2
Correlation between the specularly recorded X-ray signal (l = 0.8, wavelength λ = 0.76 Å) and Auger signals of the substrate and adsorbate as a function of deposition time, for Tl grown on Cu(001) at room temperature. Plots have been normalized and offset for clarity.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 890-892
https://doi.org/10.1107/S0909049597015550
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