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Figure 3
Crystal truncation rods and reflectivity curve for a 2 ML film of Cr grown on a cooled Ag(001) substrate, recorded using X-rays of wavelength 0.9 Å. The shaded region indicates the points that can only be accessed using the out-of-plane detector mount. The fit is outlined in the text. Plots have been offset for clarity.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
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