Improvement of beamline 4B9A and results of an X-ray diffraction experiment

Wang, D.W.; Jiang, H.Y.; Wu, Z.H.; Wu, X.S.; Jiang, S.S.; Yao, X.X.; Shao, H.M.; Cai, Y.M.; Shen, L.J.; Wu, Z.

doi:10.1107/S0909049597014477

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 2
Synchrotron X-ray diffraction pattern of the Hg-1223 film sample at the optimum annealing condition. The impurity reflections are marked by dots (•) for BaCuO₂, circles (○) for CaHgO₂ and crosses (×) for CuO.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 5| Part 3| May 1998| Pages 503-505

https://doi.org/10.1107/S0909049597014477

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