Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source

Warwick, T.; Ade, H.; Cerasari, S.; Denlinger, J.; Franck, K.; Garcia, A.; Hayakawa, S.; Hitchcock, A.; Kikuma, J.; Klingler, S.; Kortright, J.; Morisson, G.; Moronne, M.; Rightor, E.; Rotenberg, E.; Seal, S.; Shin, H.-J.; Steele, W.F.; Tonner, B.P.

doi:10.1107/S0909049597014283

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 1
The tandem layout of the two microscopes. The upstream microscope is a UHV scanning photoelectron microscope (SPEM). The photon beam passes through the SPEM chamber to the STXM, which is the last item in the beamline.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 5| Part 3| May 1998| Pages 1090-1092

https://doi.org/10.1107/S0909049597014283

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