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Figure 2
RHEED patterns: (a) 2 × 8 surface reconstruction of the Si0.79Ge0.21 substrate; (b) 3√2 × √2 surface reconstruction of a 0.7 ML Co film annealed at 723 K. The electron beam azimuth is along the [110] and [100] directions of the Si(100) substrate, respectively.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 1050-1051
https://doi.org/10.1107/S0909049597015240
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