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Figure 3
Normalized and k2-weighted EXAFS data for the samples used in this study. The top trace represents the data for a 730 Å-thick CoSi2/Si(100) film.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 1050-1051
https://doi.org/10.1107/S0909049597015240
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