Sample-angle feedback for diffraction anomalous fine-structure spectroscopy

Cross, J.O.; Elam, W.T.; Harris, V.G.; Kirkland, J.P.; Bouldin, C.E.; Sorensen, L.B.

doi:10.1107/S0909049597014313

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 2
Fe K-edge DAFS collected with sample-angle feedback on the (001) peak of an Fe/Si multilayer. The inset shows the sample reflectivity measured at 7142 eV. Four consecutive scans are overplotted in (a) and (b), two with software peak-tracking only (lower intensity) and two with additional sample-angle feedback. The bottom figure is an expanded view in the near-edge region. The scans taken without feedback have systematic high-frequency glitches as well as a slow drift away from maximum intensity. The scans taken with feedback on are almost indistinguishable and approximately 5% higher in intensity.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 5| Part 3| May 1998| Pages 911-913

https://doi.org/10.1107/S0909049597014313

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