Local structure study of dilute Er in III–V semiconductors by fluorescence EXAFS

Ofuchi, H.; Kawamura, D.; Tsuchiya, J.; Matsubara, N.; Tabuchi, M.; Fujiwara, Y.; Takeda, Y.

doi:10.1107/S0909049597018566

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Figure 3
Fourier transforms of k³χ(k) between k = 2.4 and 10.5 Å⁻¹. (a) [Er] = 1.2 × 10¹³ atoms grown at 803 K (A) and at 853 K (B), and (b) [Er] = 3 × 10¹² atoms grown at 823 K (C) and at 853 K (D).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 5| Part 3| May 1998| Pages 1061-1063

https://doi.org/10.1107/S0909049597018566

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