X-ray diffraction with a Bragg angle near π/2 and its applications

Kikuta, S.; Imai, Y.; Iizuka, T.; Yoda, Y.; Zhang, X.-W.; Hirano, K.

doi:10.1107/S0909049597018621

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 1
Experimental arrangement for observing the X-ray transmissivity and reflectivity curves from a silicon crystal plate at a Bragg angle near π/2.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 5| Part 3| May 1998| Pages 670-672

https://doi.org/10.1107/S0909049597018621

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