X-ray diffraction with a Bragg angle near π/2 and its applications

Kikuta, S.; Imai, Y.; Iizuka, T.; Yoda, Y.; Zhang, X.-W.; Hirano, K.

doi:10.1107/S0909049597018621

Journal of Synchrotron Radiation Journal of
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Figure 4
Calculated contour maps of the transmissivity (a) and reflectivity (b) from a set of two crystal plates at a Bragg angle near π/2 represented as functions of the incident angle and the gap width between two crystal plates. The (0016) reflection of silicon is used. The X-ray wavelength relevant to this reflection is about 0.6789 Å. The thickness of each plate is 0.4 mm and the gap width is changed from d₀ (≃ 0.5 mm), where d₀ is assumed to be an exact multiple of d₀₀₁₆, the (0016) lattice spacing, to d₀ + 2d₀₀₁₆. The angle 0 arcsec corresponds to the position of normal incidence. White regions indicate high X-ray intensity.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 5| Part 3| May 1998| Pages 670-672

https://doi.org/10.1107/S0909049597018621

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