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Figure 4
Diffraction patterns of a polyethylene, –(CH2)n–, measured with different monochromators: (a) measured intensities using a focused X-ray beam of λ = 1.608 Å from an Si(111) double-crystal monochromator and (b) measured intensities using unfocused X-rays of λ = 1.698 Å from the multilayer monochromator.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 705-707
https://doi.org/10.1107/S0909049597020311
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