Spectroscopic Techniques using Synchrotron Radiation and Free-Electron and Conventional Lasers

Tadjeddine, A.; Peremans, A.; Le Rille, A.; Zheng, W.Q.; Ortega, J.M.; Glotin, F.; Prazeres, R.; Meyer, M.; Lacoursiere, J.; Nahon, L.; Gisselbrecht, M.; Morin, P.; Larzilliere, M.; Marsi, M.; Taleb-Ibrahimi, A.; Couprie, M.E.; Hara, T.; Garzella, D.

doi:10.1107/S0909049597015392

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 7
Surface photovoltage versus time delay between FEL and synchrotron radiation pulses for different Si(111) surfaces: (a) high-quality 2 × 1 reconstructed surface, (b) partially contaminated and (c) with strong contamination-induced defects.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 5| Part 3| May 1998| Pages 293-298

https://doi.org/10.1107/S0909049597015392

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