Figure 2
Schematic drawing of the experimental apparatus for the time-resolved FXI technique. Synchrotron radiation was used for the polychromatic X-ray beam, with a mirror for X-ray total external reflection. The glancing angle for the primary X-ray beam is fixed at an angle at which the total intensity of fluorescent X-rays was maximized. We used an imaging plate as a two-dimensional detector to observe the overall structure of the interference fringes. |