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Figure 2
Schematic drawing of the experimental apparatus for the time-resolved FXI technique. Synchrotron radiation was used for the polychromatic X-ray beam, with a mirror for X-ray total external reflection. The glancing angle for the primary X-ray beam is fixed at an angle at which the total intensity of fluorescent X-rays was maximized. We used an imaging plate as a two-dimensional detector to observe the overall structure of the interference fringes.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 1075-1078
https://doi.org/10.1107/S0909049598002787
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