view article
Figure 3
(a) Structure of the sample: cross section of a monolayer of Zn arachidate on the evaporated Si thin film. We used an Rh substrate. The observed interference fringes (right) from the Zn monolayer were measured with the IP. The exposure time was 3 s. (b) The four clear fringes were revealed under magnification. The brighter region corresponds to a higher X-ray intensity.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 1075-1078
https://doi.org/10.1107/S0909049598002787
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS