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Figure 4
Intensity from detector scans measured at 17.48 keV (Mo Kα) for a Pt/C multilayer deposited on a 2 mm-thick SiO2 wafer. The rest is the same as in Fig. 3[link] except that a CdZnTe solid-state detector with a 0.15 mm slit was used and the beam size was defined by a 0.1 mm slit in the incident beam.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 693-695
https://doi.org/10.1107/S0909049598000958
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