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Figure 4
Intensity from detector scans measured at 17.48 keV (Mo Kα) for a Pt/C multilayer deposited on a 2 mm-thick SiO2 wafer. The rest is the same as in Fig. 3 ![]() |
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Figure 4
Intensity from detector scans measured at 17.48 keV (Mo Kα) for a Pt/C multilayer deposited on a 2 mm-thick SiO2 wafer. The rest is the same as in Fig. 3 ![]() |