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Figure 1
Sample growth is monitored in a layer-by-layer fashion using RHEED intensity oscillations. The shutters of the evaporators are controlled by a phase-locked epitaxy technique using a computer.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 1038-1040
https://doi.org/10.1107/S0909049597016129
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