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Figure 4
Vertical and horizontal beam profiles at the sample position. The spot size was measured using the total electron yield from a screen scanned through the focus with a 0.1 mm step.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 539-541
https://doi.org/10.1107/S0909049597016087
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