Characterization of Thin Polymer Films by X-ray Reflectometry with Synchrotron Radiation

Kago, K.; Endo, H.; Matsuoka, H.; Yamaoka, H.; Hamaya, N.; Tanaka, M.; Mori, T.

doi:10.1107/S0909049598006797

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 3
Relation between the position of the maxima of the Kiessig fringes, θ_m, and the interference order m for PMMA thin film on a glass plate. The slope of the straight line corresponds to λ/2d.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 5| Part 5| September 1998| Pages 1304-1308

https://doi.org/10.1107/S0909049598006797

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