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Figure 1
Diagram to illustrate the difference between XAFS and DAFS. When an incident X-ray beam with energy slightly above the absorption edge of Ga hits Ga atoms (statistically distributed among grey circles on the left and placed on white circles on the right) at Bragg angle θ, characteristic Ga K radiation from atoms all over the specimen will be collected using the XAFS detector. The DAFS detector, however, will see a Bragg reflection intensity from the ordered part of the specimen only (right), which in turn is influenced solely by those resonant atoms which contribute to the Bragg reflection. Using a superlattice reflection of rhombohedrally ordered (Ga,In)P, DAFS thus probes the short-range order of a subset of Ga atoms instead of averaging all Ga atoms.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 5| September 1998| Pages 1275-1281
https://doi.org/10.1107/S0909049598004026
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