DAFS Experiments with Non-Centrosymmetric Single Crystals

Meyer, D.C.; Richter, K.; Seidel, A.; Weigelt, J.; Frahm, R.; Paufler, P.

doi:10.1107/S0909049598004026

Journal of Synchrotron Radiation Journal of
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Figure 5
DAFS reflection intensities of the specimen (line) and curves of |A₀|² (dashed) corrected with respect to the absorption of the radiation on its path through the (Ga,In)P layer and normalized with respect to the theoretical intensities. (a) (Ga,In)P 333 reflection. (b) (Ga,In)P $[\overline{3}33]$ reflection.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 5| Part 5| September 1998| Pages 1275-1281

https://doi.org/10.1107/S0909049598004026

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