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Figure 4
A double-axis θ/2θ scan with Si(111) sample and monochromator reflections.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 5| September 1998| Pages 1263-1269
https://doi.org/10.1107/S0909049598006803
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