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Figure 4
The observed (points) and calculated (lines) profiles for the (111) reflections of the CeO2/Si mixture (λ = 0.7500 Å) using PF1 (squares) and PF2 (crosses). For clarity the PF1 data have been shifted above the PF2 data. Note that the PF1 peak profile is better resolved than that of PF2.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 5| September 1998| Pages 1270-1274
https://doi.org/10.1107/S0909049598007870
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