Ab initio structure determination of low-molecular-weight compounds using synchrotron radiation Laue diffraction

Ravelli, R.B.G.; Raves, M.L.; Scheres, S.H.W.; Schouten, A.; Kroon, J.

doi:10.1107/S0909049598011595

Journal of Synchrotron Radiation Journal of
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Figure 3
Cumulative distribution function of $[z = \left\langle \alpha \right\rangle /\sigma_{\alpha}]$ , as defined by Giacovazzo et al. (1994

). For all our Laue data sets, z values larger than 3 are found for most of the strong reflections, indicating that the systematic incompleteness of these data sets would not impose serious limitations on application of direct methods.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 6| Part 1| January 1999| Pages 19-28

https://doi.org/10.1107/S0909049598011595

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