Pressure and temperature dependence of EXAFS Debye–Waller factors in diamond-type and white-tin-type germanium

Yoshiasa, A.; Nagai, T.; Ohtaka, O.; Kamishima, O.; Shimomura, O.

doi:10.1107/S0909049598011947

Journal of Synchrotron Radiation Journal of
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Figure 2
Magnitude of the Fourier transform of EXAFS for Ge measured at 10⁵ Pa (1 bar) and 300 K (diamond type), 11.8 GPa and 300 K (white-tin type) and 10.0 GPa and 700 K (white-tin-type structure). The EXAFS phase shift has not been removed.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 6| Part 1| January 1999| Pages 43-49

https://doi.org/10.1107/S0909049598011947

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