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Figure 3
(a) Raw data collected from orthorhombic phase-II of GaAs. The arrows highlight the impurity peaks and the asterisks mark the positions of very weak reflections, the existence of which is crucial for correct indexing of the pattern (an enlargement of the region around the weak peaks is shown in the inset). (b) The Le Bail fit of the calculated data (solid line) to the observed data (crosses) when the pattern in correctly indexed. Regions (1) and (2) are discussed in the text.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 6| Part 2| March 1999| Pages 87-92
doi:10.1107/S0909049598017932
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