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Figure 6
Dependence of the phase of an X-ray standing wave field on the incidence angle θ (or the photon energy). Displayed is the secondary yield I which equals the scaled intensity of the electric field in the crystal. A, high-angle flank of the reflection curve (θ > θB or E > EB); B, peak of the reflection curve; C, low-angle flank of the reflection curve (θ ≃ θB or E ≃ EB). For simplicity, it is assumed that R = 0.5, ν = 0 for A, R = 1, ν = π/2 for B and R = 0.5, ν = π for C [cf. equation (5)[link]]. Note the shift of the nodes/antinodes.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 6| Part 2| March 1999| Pages 105-111
doi:10.1107/S0909049598018317
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