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Figure 1
(a) X-ray detection efficiency for 300 µm-thick Si (squares), 200 µm- and 300 µm-thick GaAs (triangles and circles, respectively); (b) Measured MTF for ![]() |
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Figure 1
(a) X-ray detection efficiency for 300 µm-thick Si (squares), 200 µm- and 300 µm-thick GaAs (triangles and circles, respectively); (b) Measured MTF for ![]() |