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Figure 6
Components of the resolution function in the scattering plane. These include the Johann error (a), the effect of the axial divergences of the scattered beam (b), the intensity distribution of the 31.77 keV incident beam, as limited by a 0.3 mm slit (c), absorption in a disc-like 0.75 mm-thick Si sample in symmetrical reflection geometry (d), energy band of the incident beam from an Si(111) monochromator (e), and the reflectivity of the Si(400) analyser crystal (ρ = 7 m, α = 3.17°) (f). A convolution of these functions is shown in (g). The measured profile of the elastic line is given by circles in (h) together with the calculated curve.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 6| Part 2| March 1999| Pages 69-80
doi:10.1107/S0909049599000291
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