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Figure 7
As-recorded spectra from a single-crystal Al sample using different monochromator and analyser crystals. The vertical scale is proportional to the square root of the intensity to emphasize the background. In (a), an Si(220) monochromator and Ge(440) analyser with [001] axis are used. The incident energy is 49 keV. Different parasitic contributions are identified, and they are discussed in §4.4[link]. In (b), an Si(311) monochromator and Ge(440) analyser with [¯110] axis are used. The incident energy is 58 keV. The `glitch' in the Compton profile at 7.494° is due to `Aufhellung' by Ge(hk1) reflections.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 6| Part 2| March 1999| Pages 69-80
doi:10.1107/S0909049599000291
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