Figure 8
Processing the spectrum of scattered radiation. The sample is YBa2Cu3O7 and the energy of the incident radiation is 57 keV. The upper panel shows the raw data (dash-dotted), the correction of the intensity due to changes in the response function and scattering cross section (broken line), the background with a fitted curve, and the final Compton profile (solid line). The analysis of the components of scattering are shown in the three lower panels. The components include the proper energy, for instance the elastic line in the panel to the right; the escape peak at about 30 keV lower energy due to iodine fluorescence in the detector; Ba, Y and Cu fluorescence entering the detector by air scattering; and Ge fluorescence from the analyser crystal. The solid line shows the fit of these components to the energy spectrum recorded by the NaI detector. |