view article

Figure 5
Laue diffraction from a polycrystalline aluminium disk rotating at 2500 r.p.m. A beam of size 1 × 1 mm2 impinged upon the 180 mm-diameter disk ∼10 mm from its periphery. Sample-to-detector distance was 30 mm. The peaks visible in the images are the superposition of many oriented grains of the sample. The eight images were obtained as the disk rotated through an angular range of 15°. Integration time was 100 µs per frame with 25 µs interframe delay. Frames are labeled in sequence from 1 to 8. Image 8 is placed next to image 1 to highlight the angular change in the diffraction pattern. The beam position was off the imaging area to the right of each frame. In the upper right of each image one can see the shadow of the 100 µm-diameter wire used to bias the front surface of the diode layer.

Journal logoJOURNAL OF
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds