Rapid and sensitive XAFS using a tunable X-ray undulator at BL10XU of SPring-8

Oyanagi, H.; Ishii, M.; Lee, C.-H.; Saini, N.L.; Kuwahara, Y.; Saito, A.; Izumi, Y.; Hashimoto, H.

doi:10.1107/S0909049599016817

Figure 5
(a) Plan view and (b) front view of a high-brilliance XAFS apparatus installed at BL10XU, SPring-8. Using a χ-circle, a sample on a cryostat can be oriented with either a vertical or horizontal geometry.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 7| Part 2| March 2000| Pages 89-94

doi:10.1107/S0909049599016817

Follow J. Synchrotron Rad.

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