Rapid and sensitive XAFS using a tunable X-ray undulator at BL10XU of SPring-8

Oyanagi, H.; Ishii, M.; Lee, C.-H.; Saini, N.L.; Kuwahara, Y.; Saito, A.; Izumi, Y.; Hashimoto, H.

doi:10.1107/S0909049599016817

Figure 9
Expanded Ru K-XAFS spectrum for PrRu₄P₁₂ (top) plotted as a function of photon energy (keV) measured in transmission mode (Lee et al., 1999

). I₀ intensity variation as undulator and monochromator are scanned from 22.9 keV down to 22.1 keV (bottom).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 7| Part 2| March 2000| Pages 89-94

doi:10.1107/S0909049599016817

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