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Figure 6
Grain mapping of the top layer in a Cu polycrystal by electron microscopy (EBSP) (top), and using the hard X-ray CS set-up illustrated in Fig. 1[link] (bottom). Also shown are the determined 〈200〉 pole figures for the individual grains. The boundary of grain P was measured using a (200) reflection from grain P (solid line) as well as (200) reflections from neighbouring grains X, O and Q (dashed lines).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 7| Part 2| March 2000| Pages 103-109
doi:10.1107/S0909049500000625
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