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Figure 4
Laue beam diffracted upwards with a scattering angle of 2θL, and the Bragg beam reflected downwards with an angle of 2θB. The diffraction angle can be derived from a measurement of 2ω and the δ index of refraction. The rotary table is used to adjust the Si piece position; let 840 and [\bar480] atomic planes be parallel to their tilting stages.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 7| Part 3| May 2000| Pages 189-195
doi:10.1107/S0909049500003757
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