view article
Figure 6
Laue diffraction images for the same PYP crystal collected using U26 and W70 insertion devices. Crystal orientation is not identical but it is very similar. The W70 image is displayed on an intensity scale that is ten times the scale of the U26 image for an easier visual comparison. The surface plots represent the same region of the image (the region is enclosed by the box) in two cases, illustrating the background noise in relation to the diffraction spot intensities. The background level within the dashed box is ∼40 counts pixel−1 for U26 and ∼580 counts pixel−1 for W70. The peak-to-background ratio for the strongest reflection in this box is 34 for U26 and 10 for W70.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 7| Part 4| July 2000| Pages 236-244
https://doi.org/10.1107/S0909049500004672
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS