Extraction of accurate structure-factor amplitudes from Laue data: wavelength normalization with wiggler and undulator X-ray sources

Srajer, V.; Crosson, S.; Schmidt, M.; Key, J.; Schotte, F.; Anderson, S.; Perman, B.; Ren, Z.; Teng, T.; Bourgeois, D.; Wulff, M.; Moffat, K.

doi:10.1107/S0909049500004672

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Figure 7
Plot of $[(F\,^2-\langle{F}\,^2\rangle)/\sigma_{\langle{F}\,^2\rangle}]$ versus resolution for U26 and W70. The scatter in $[(F\,^2-\langle{F}\,^2\rangle)/\sigma_{\langle{F}\,^2\rangle}]$ at low resolution is much higher in the case of U26. All the reflections are treated as fully recorded in both cases.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 7| Part 4| July 2000| Pages 236-244

https://doi.org/10.1107/S0909049500004672

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