Effect of surface roughness on the spatial coherence of X-ray beams from third-generation synchrotron radiation sources

Wang, Y.; Xiao, T.; Xu, H.

doi:10.1107/S0909049500004234

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 4
Fringes patterns and their transverse profiles of intensity at 1.0 Å (12 keV) and different surface roughnesses of the Be window: (a) 0 µm, (b) 0.1 µm, (c) 0.2 µm, (d) 0.5 µm, (e) 1.0 µm, (f) 5.0 µm.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 7| Part 4| July 2000| Pages 209-214

https://doi.org/10.1107/S0909049500004234

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