A new X-ray spectrometer for high-resolution Compton profile measurements at SPring-8

Hiraoka, N.; Itou, M.; Ohata, T.; Mizumaki, M.; Sakurai, Y.; Sakai, N.

doi:10.1107/S0909049500018197

Figure 7
Energy spectrum of the Bi- $[K\alpha_1]$ line measured using the spectrometer. From the width of the measured spectrum and the natural width of the fluorescence line, we obtain 80 eV in FWHM for the energy resolution of the spectrometer.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 8| Part 1| January 2001| Pages 26-32

doi:10.1107/S0909049500018197

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