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Figure 2
X-ray interferometer using simultaneous three-beam case diffraction hkl, [hk\bar{l}]. S, M1, M2, A: Bragg diffracting crystal wafers for coherent splitting and superposition of interfering beams. Sa: sample; Δz(W): separation of beams in vertical (horizontal) direction. Note doubling of incident beam width X0 when W = X0.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 8| Part 1| January 2001| Pages 1-5
doi:10.1107/S0909049500015843
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