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Figure 1
Raw piezo-QEXAFS (Cu K-edge, 9.1 Hz, 55 ms per spectrum, 50 kHz ADC rate) of a Cu-metal foil (thickness 6.8 µm) measured in (a) transmission and (b) fluorescence. Twenty subsequently measured `up' spectra are shown. |
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Figure 1
Raw piezo-QEXAFS (Cu K-edge, 9.1 Hz, 55 ms per spectrum, 50 kHz ADC rate) of a Cu-metal foil (thickness 6.8 µm) measured in (a) transmission and (b) fluorescence. Twenty subsequently measured `up' spectra are shown. |